Institut für Mikroproduktionstechnik Forschung Publikationen
Slurry Comparison for Chemical-mechanical Polishing (CMP) of Silicon Carbide (SiC)

Concept for Distinction Between the Circumferential and Sidewall Effects during Dicing of Single Crystal Silicon

Kategorien Konferenz (reviewed)
Jahr 2007
Autoren S. Cvetkovic, H.H. Gatzen
Veröffentlicht in Proc. ASPE 22nd Ann. Meet. 2007, Dallas, TX, USA, pp. 386-389