Development, characterisation and high-temperature suitability of thin-film strain gauges directly deposited with a new sputter coating system

verfasst von

Daniel Klaas, Rico Ottermann, Folke Dencker, Marc Christopher Wurz

Abstract

New sensor and sensor manufacturing technologies are identified as a key factor for a successful digitalisation and are therefore economically important for manufacturers and industry. To address various requirements, a new sputter coating system has been invented at the Institute of Micro Production Technology. It enables the deposition of sensor systems directly onto technical surfaces. Compared to commercially available systems, it has no spatial limitations concerning the maximum coatable component size. Moreover, it enables a simultaneous structuring of deposited layers. Within this paper, characterisation techniques, results and challenges concerning directly deposited thin film strain gauges with the new sputter coating system are presented. Constantan (CuNiMn 54/45/1) and NiCr 80/20 are used as sensor materials. The initial resistance, temperature coefficient of resistance and gauge factor/k-factor of quarter-bridge strain gauges are characterised. The influence of a protective layer on sensor behaviour and layer adhesion is investigated as well. Moreover, the temperature compensation quality of directly deposited half-bridge strain gauges is evaluated, optimised with an external trimming technology and benchmarked against commercial strain gauges. Finally, the suitability for high-temperature strain measurement is investigated. Results show a maximum operation temperature of at least 400^◦ C, which is above the current state-of-the-art of commercial foil-based metal strain gauges.

Organisationseinheit(en)

Institut für Mikroproduktionstechnik

Typ

Artikel

Journal

Sensors (Switzerland)

Band

20

Seiten

1-15

Anzahl der Seiten

15

ISSN

1424-8220

Publikationsdatum

10.06.2020

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Analytische Chemie, Biochemie, Atom- und Molekularphysik sowie Optik, Instrumentierung, Elektrotechnik und Elektronik

Elektronische Version(en)

https://doi.org/10.3390/s20113294 (Zugang: Offen)
https://doi.org/10.15488/9948 (Zugang: Offen)