Nano-Roughness Standards with a Very Low Roughness Value
| Kategorien |
Konferenz (reviewed) |
| Jahr | 2003 |
| Autorinnen/Autoren | H.H. Gatzen, C. Kourouklis |
| Veröffentlicht in | Proc. euspen 4th Int. Top. Conf. 2003, Aachen, Germany, Vol. 2, pp. 495-498 |
