The Fabrication of Nano-Roughness Standards for the Calibration of Atomic Force Microscopes
| Kategorien |
Konferenz (reviewed) |
| Jahr | 2001 |
| Autoren | H.H. Gatzen, C. Kourouklis |
| Veröffentlicht in | Proc. ASPE 16th Ann. Meet. 2001, Virginia, USA, pp. 493-496 |
