Concept for a Wafer Level Test System for Measuring Magnetic Film Properties
| Kategorien |
Zeitschriften/Aufsätze |
| Jahr | 2007 |
| Autoren | H.H. Gatzen, D. Dinulovic, E. Flick, H. Gerdes, K. Feindt, M. Eccarius |
| Veröffentlicht in | Symposium on Magnetic Materials, Processes and Devices, 210th Meet. of The Electrochemical Society, Cancun, Mexico, 2006, ecs transactions, Vol. 3, Issue 25, pp. 165-177 |
