Electroplating of Cu/Sn Layers for Hermetic Encapsulation for Vacuum Applications
Kategorien |
Konferenz (reviewed) |
Jahr | 2012 |
Autoren | L. Rissing, M. Wurz, S. Cvetkovic, F.-W. Bach |
Veröffentlicht in | Trans. 222nd ECS Meeting, Honolulu, Hawaii, Vol. 50, No. 10, pp. 207-216 |