ForschungPublikationen
Grinding Tool Topography Analysis by White Light Interferometry and Atomic Force Microscopy

Grinding Tool Topography Analysis by White Light Interferometry and Atomic Force Microscopy

Kategorien Konferenz (reviewed)
Jahr 1997
Autoren H.H. Gatzen, J.C. Mätzig, L.P. Ruhbach
Veröffentlicht in Proc. 9th Precision Engineering 1997, Braunschweig