ForschungPublikationen
Nano-Roughness Standards with a Very Low Roughness Value

Nano-Roughness Standards with a Very Low Roughness Value

Kategorien Konferenz (reviewed)
Jahr 2003
Autoren H.H. Gatzen, C. Kourouklis
Veröffentlicht in Proc. euspen 4th Int. Top. Conf. 2003, Aachen, Germany, Vol. 2, pp. 495-498