ForschungPublikationen
The Fabrication of Nano-Roughness Standards for the Calibration of Atomic Force Microscopes

The Fabrication of Nano-Roughness Standards for the Calibration of Atomic Force Microscopes

Kategorien Konferenz (reviewed)
Jahr 2001
Autoren H.H. Gatzen, C. Kourouklis
Veröffentlicht in Proc. ASPE 16th Ann. Meet. 2001, Virginia, USA, pp. 493-496