ForschungPublikationen
Concept for a Wafer Level Test System for Measuring Magnetic Film Properties

Concept for a Wafer Level Test System for Measuring Magnetic Film Properties

Kategorien Konferenz (reviewed)
Jahr 2006
Autoren D. Dinulovic, E. Flick, H. Gerdes, K. Feindt, M. Eccarius, H.H. Gatzen
Veröffentlicht in 210th Meet. of The Electrochemical Society 2006, Cancun, Mexico