Concept for a Wafer Level Test System for Measuring Magnetic Film Properties
| Kategorien |
Konferenz (reviewed) |
| Jahr | 2006 |
| Autoren | D. Dinulovic, E. Flick, H. Gerdes, K. Feindt, M. Eccarius, H.H. Gatzen |
| Veröffentlicht in | 210th Meet. of The Electrochemical Society 2006, Cancun, Mexico |
