Institut für Mikroproduktionstechnik Forschung Publikationen
Atom Chip technology for use under UHV conditions

NiFe 45/55 and its Application in a Strain Gauge Sensor

Kategorien Konferenz (reviewed)
Jahr 2004
Autoren A. Ben Amor, C. Ruffert, H.H. Gatzen
Veröffentlicht in Proc. 8th Int. Symposium on Magnetic Materials, Processes and Devices, 206th Meet. of The Electrochemical Society 2004, Honolulu, Hawaii, USA, pp. 481-492